Test & Measurement

Bench Top Instruments

Angle Position Indicator

Angle Position Indicator (API) is a rack mount or benchtop measurement instrument featuring two fully independent inputs that can be used to read two separate input signals simultaneously, or can be combined to measure multi-speed Synchros or Resolvers. Improved flexibility is provided by front panel controls and input terminals.

Phase Angle Voltmeters

Model 2250A: Phase Angle Voltmeter is the most accurate AC measurement tool in the Synchro/Resolver and LVDT/RVDT. This precision instrument measures total, fundamental, harmonics, in-phase, quadrature, frequency, THD, ratio, and phase angle, and displays all of these measurements at the same time. The isolated inputs enable null, ratio, and gain measurements.

Synchro/Resolver Simulator

Model 5330A

Synchro/Resolver Simulator is a rack mount or benchtop instrument featuring two fully independent outputs that can be used to simulate two separate Synchro or Resolver signals simultaneously, or can be combined to operate as two-speed outputs. Improved flexibility is provided by integrated touch screen controls and input terminals.

High Accuracy Model 5300

This model can be used as a true Synchro/Resolver standard for calibrating and testing Automatic Test Equipment (ATE) for Calibration/Metrology Labs, and for Engineering Design and Production Test environments. It can also be used to measure Angle Position Indicators (API) and Synchro-to-Digital converters for static or dynamic characteristics.

JTAG Boundary Scan Solutions

Hardware – JTAG Boundary-Scan Controllers

NetUSB II

High-performance, multi-feature boundary-scan controller for multi-TAP and concurrent JTAG test and in-system programming. Featuring dual-interface USB and LAN support with four or eight independent and configurable Test Access Ports (TAPs), direct serial programming capability and voltage sense support, the NetUSB II fits a multitude of boundary-scan applications.

NetUSB-1149.1/E

High performance, multi-feature boundary-scan controller for multi-TAP and concurrent JTAG test and in-system programming. Featuring dual-interface USB and LAN support with four independent Test Access Ports (TAPs), direct serial programming capability and voltage sense support, the NetUSB-1149.1/E fits a multitude of boundary-scan applications.

USB-1149.1/1E

USB-1149.1/1E High-Speed single-TAP boundary-scan controller is a powerful, portable USB JTAG instrument for all JTAG applications and life cycle phases. Works with the complete Corelis ScanExpress™ family of software, enabling comprehensive test coverage at a fraction of the cost of traditional bed-of-nails testers and without the inconvenience of fixtures.

SCANIO

SCANIO modules turn any IEEE standard 1149.1 boundary-scan controller into a powerful digital boundary-scan tester. The SCANIO family of products use boundary-scan gate arrays to add control and visibility to connectors, traces, and logic that can not be tested using traditional boundary-scan techniques.

JTAG Starter Kit

Debug and visualize prototype hardware faults, even on component pins with no physical access. JTAG Starter Kit provides everything necessary to get started using JTAG, yet still provides a flexible upgrade path to higher performance controllers and integration with high-end Corelis applications.

JTAG 3rd Party Controller Support

Corelis offers support for a variety of devices and instruments from third-parties in an effort to provide existing test platforms comprehensive JTAG test execution with Corelis ScanExpress software products

PCIe-1149.1/ PCI-1149.1/Turbo

PCIe/ PCI based Boundary-scan controller for multi-TAP (Test Access Port) and concurrent JTAG test and in-system programming. Combined with a ScanTAP™ intelligent pod, the PCIe-1149.1 offers up to 80 MHz clock rates on 4 or 8 TAPs with features such as external write strobe, direct programming, and analog voltage measurement.

CPXI-1149.1/Turbo

PXI/cPCI based Boundary-scan controller for multi-TAP (Test Access Port) and concurrent JTAG test and in-system programming. Combined with a ScanTAP™ intelligent pod, the CPXI-1149.1/Turbo offers up to 80 MHz clock rates on 4 or 8 TAPs with features such as external write strobe, direct programming, and analog voltage measurement.

ScanTAP 4 & 8

ScanTAP pods are designed for use with PCI-1149.1/Turbo and PCIe-1149.1 high-speed JTAG controllers. Featuring 4 & 8 independent Test Access Ports (TAPs), up to 80 MHz clock rates, and advanced TAP capabilities for high-performance environments.

Test and Programming- ScanExpress Software

Test Development System

ScanExpress TPG – Test Pattern GenerationScanExpress TPG – Test Pattern Generation

ScanExpress TPG is a next generation intelligent test pattern generator that takes the process of boundary-scan automation to a new level in both performance and ease of use.

ScanExpress JET – JTAG Embedded Test

Used to automatic circuit board testing by extending boundary-scan structural test coverage to virtually every signal on the board that is accessible by an on-board CPU.

ScanExpress DFT Analyzer – Design for Testability Metrics:

Automatic test coverage analysis tool for printed circuit boards and systems for boundary and non-boundary-scan devices. Increase fault coverage and reduce boundary-scan test procedure.

Test Execution System

ScanExpress Runner – Test Program Execution

Fully featured JTAG test executive; a modern software application that provides the capabilities and options necessary to ensure a smooth and complete testing process.

ScanExpress Runner Gang – High Volume Test Program Execution

Workhorse software piece to perform parallel gang testing and In-System Programming of CPLDs and Flash devices.

ScanExpress Viewer – Visual Fault Identification System

Powerful graphical fault identification system that helps to isolate source and location of faults encountered during boundary-scan test of PCB.

ScanExpress ADO – Advanced Diagnostics

Fully automated analysis option quickly parses test vectors and identifies faults down to the net and pin level.

ScanExpress Merge – System-Level Interconnect Solution

Designed to import and join test files for multiple independent assemblies and assist in configuration of a combined test procedure.

ScanExpress JTAG Debugger – Interactive Debugging

Provides complete pin control over any boundary-scan device. overcomes these limitations to provide the control and visibility.

Boundary-Scan In-System Programming (ISP) Tools

ScanExpress JTAG Programmer – In-Circuit Programming Tool

Universal in-circuit programming tool that can program and verify Flash memories, serial EEPROMs, CPLDs, FPGAs, and other programmable logic devices.

ScanExpress Flash Generator – Flash Programming File Generation Tool

Creates a Board File, which is used to provide ScanExpress Programmer with the necessary information to program a target board configuration.

Bus Analyzers And Exercisers

BusPro-I

Bus Analyzer, Monitor, Debugger and Programmer– Monitor and log I2C bus traffic in real-time, generate I2C transactions to communicate with components on the bus, and perform in-system programming of I2C EEPROMs.

CAS-1000-I2C/E

Bus Analyzer, Exerciser, Emulator, and Programmer– Provides functionality of BusPro-I analyzer as well as additional features and capabilities towards automated system test, component verification, and parametric testing.

BusPro-S SPI Bus Host Adapter

High Speed Multi-IO SPI Host, Debugger, and Programmer -Featuring 60 MHz upto 200 Mb/s throughput and supports standard, dual, quad, and 3-wire modes, BusPro-S is right tool for all SPI debugging applications.

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